QIND

Pressure and level sensors, for example, will demonstrate the advantages of NV-based quantum sensors in industrial applications, especially with regard to high pressure and temperature requirements as well as touch-free calibration and contact. Based on a new sensor concept including corresponding sensor signal processing, the assembly and connection technology (AVT) also requires new approaches to integrate all components in the respective application.

Under industrial process conditions (-60°C to +200°C), the process will be showcased both as a robust pressure sensor for pressures from 10 kPa to 200 MPa and as a level sensor for a non-invasive measurement in containers for processes up to 250°C /400°C and pressures between 100 bar and 300 bar.

In this new type of pressure sensor, the physical quantity of pressure is recorded directly by NV centers. An optimized diamond layer and a silicon-based optical transmitter-receiver micro module are ideally matched to each other by newly developed AVT processes.

The level sensor system detects changes in magnetic flux density as a function of magnetic susceptibility. These typically occur during media changes inside containers, such as between air and liquids. NV centers are also used there to detect the finest variations. The high sensitivity requires a special guidance of the magnetic field as well as a good shielding against external electromagnetic radiation. In this joint project IMS CHIPS is responsible for the development of the optical transmitting and receiving module with the corresponding sensor signal evaluation. In addition to the design of efficient antennas for microwave excitation of the NV centers, components for effective signal pre-processing as well as for signal detection and evaluation will also be developed. Downstream production processes can process this data accordingly.